IEEE - Institute of Electrical and Electronics Engineers, Inc. - Proton, neutron, and gamma degradation of optocouplers

Author(s): J.L. Gorelick ; R. Ladbury
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2004
Volume: 51
Page(s): 3,730 - 3,735
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2004.839249
Regular:

Optocouplers from two different suppliers were subjected to proton, neutron, and gamma irradiations. A simple transistor model was used to compare degradation in current transfer ratio (CTR) from... View More

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