IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transmission line analysis of MRAM cell

Author(s): S. Park ; S. Jo
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2004
Volume: 40
Page(s): 2,089 - 2,091
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/TMAG.2004.832112
Regular:

A test configuration of magnetic random access memory (MRAM) unit cell was modeled and its three-dimensional finite element method (FEM) analysis was utilized to calculate S-parameters.... View More

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