IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental characterization of on-chip inductor and capacitor interconnect: part II. Shunt case

Author(s): W.Y. Yin ; L.W. Li ; S.J. Pan ; Y.B. Gan
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2004
Volume: 40
Page(s): 1,657 - 1,663
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/TMAG.2004.826627
Regular:

We present a wide-band experimental characterization of an on-chip shunt inductor and capacitor (LC) interconnect. (A previous paper by the authors considered the series LC case). In order to... View More

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