IEEE - Institute of Electrical and Electronics Engineers, Inc. - Relaying Difficulties Disclosed by Staged-Fault Tests

Author(s): W. A. Morgan ; Byron Evans
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1948
Volume: 67
Page(s): 73 - 82
ISSN (Paper): 0096-3860
DOI: 10.1109/T-AIEE.1948.5059644
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