IEEE - Institute of Electrical and Electronics Engineers, Inc. - Susceptibility of electronic systems to high-power microwaves: summary of test experience

Author(s): M.G. Backstrom ; K.G. Lovstrand
Sponsor(s): IEEE Electromagnetic Compatibility Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2004
Volume: 46
Page(s): 396 - 403
ISSN (Paper): 0018-9375
ISSN (Online): 1558-187X
DOI: 10.1109/TEMC.2004.831814
Regular:

For more than a decade, the Swedish Defence Authorities have, in cooperation with Swedish industry and other countries, studied the effects of high-power microwave (RPM) radiation on electronic... View More

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