IEEE - Institute of Electrical and Electronics Engineers, Inc. - The influence of the dielectric strength of the N/sub 2//SF/sub 6/-insulation by conducting particle on the spacer surface

Author(s): A. Moukengue Imano
Sponsor(s): Nat. Natural Sci. Found. China
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2003
Volume: 10
Page Count: 8
Page(s): 483 - 490
ISSN (Paper): 1070-9878
DOI: 10.1109/TDEI.2003.1207476
Regular:

This paper investigates the dielectric properties of various N/sub 2//SF/sub 6/ gas mixtures based upon a cylindrical spacer model with adhering particle on the surface tinder homogeneous field... View More

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