IEEE - Institute of Electrical and Electronics Engineers, Inc. - Variable temperature scanning laser microscopy of wider width high temperature superconducting films

Author(s): L.B. Wang ; M.B. Price ; C. Kwon ; Q.X. Jia
Sponsor(s): Council on Superconductivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2003
Volume: 13
Page Count: 3
Page(s): 2,611 - 2,613
ISSN (Paper): 1051-8223
ISSN (Online): 1558-2515
DOI: 10.1109/TASC.2003.811908
Regular:

We have investigated the spatial distribution of resistive properties in 2 mm wide and 10 mm long epitaxial superconducting films using a variable temperature scanning laser microscopy (VTSLM).... View More

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