IEEE - Institute of Electrical and Electronics Engineers, Inc. - Relation between critical current density and flux flow resistivity in Bi2223 bulk element for fault current limiter

Author(s): T. Aritake ; T. Noda ; H. Shimizu ; Y. Yokomizu ; T. Matsumura ; N. Murayama
Sponsor(s): Council on Superconductivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2003
Volume: 13
Page Count: 4
Page(s): 2,084 - 2,087
ISSN (Paper): 1051-8223
ISSN (Online): 1558-2515
DOI: 10.1109/TASC.2003.812983
Regular:

The relationship between the critical current density and flux flow resistivity in a Bi2223 bulk for fault current limiter application was experimentally investigated. The distributions of J/sub... View More

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