IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability prediction modeling of semiconductor light emitting device

Author(s): Jingsong Xie ; M. Pecht
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2003
Volume: 3
Page Count: 5
Page(s): 218 - 222
ISSN (Paper): 1530-4388
ISSN (Online): 1558-2574
DOI: 10.1109/TDMR.2003.820294
Regular:

This paper presents a probabilistic-approach-based reliability prediction model of semiconductor light emitting devices. Using this model with given initial light-emitting performance and... View More

Advertisement