IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enforced isolation processes and data

Author(s): T.D. Tarman ; E.L. Witzke ; L.G. Pierson ; P.L. Campbell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2003
Volume: 18
Page(s): 9 - 12
ISSN (Paper): 0885-8985
DOI: 10.1109/MAES.2003.1224966
Regular:

This paper highlights the problem of run-time execution correctness of high consequence applications in conventional Von Neumann computer architectures. It proposes an approach - trusted objects -... View More

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