IEEE - Institute of Electrical and Electronics Engineers, Inc. - Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment

Author(s): Chunsheng Liu ; K. Chakrabarty
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2003
Volume: 22
Page Count: 12
Page(s): 593 - 604
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2003.810739
Regular:

We present a new scan built-in self-test (BIST) approach for determining failing vectors for fault diagnosis. This approach is based on the application of overlapping intervals of test vectors to... View More

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