IEEE - Institute of Electrical and Electronics Engineers, Inc. - A unified approach to reduce SOC test data volume, scan power and testing time

Author(s): A. Chandra ; K. Chakrabarty
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2003
Volume: 22
Page Count: 11
Page(s): 352 - 363
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2002.807895
Regular:

We present a test resource partitioning (TRP) technique that simultaneously reduces test data volume, test application time, and scan power. The proposed approach is based on the use of... View More

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