IEEE - Institute of Electrical and Electronics Engineers, Inc. - Impact of mechanical stress on total-dose effects in bipolar ICs

Author(s): J. Boch ; D.M. Fleetwood ; R.D. Schrimpf ; R.R. Cizmarik ; F. Saigne
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2003
Volume: 50
Page Count: 6
Page(s): 2,335 - 2,340
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2003.820768
Regular:

Experiments conducted at high and low dose rates show that the total dose response of bipolar linear integrated circuits is influenced by mechanical stress. The role of mechanical stress on... View More

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