IEC - International Electrotechnical Commission - IEC 62969-4:2018
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 18 June 2018 |
| Status: | published |
| Page Count: | 39 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
abstract:
IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle... View More
Document History
IEC 62969-4:2018
June 18, 2018
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications...