IEEE - Institute of Electrical and Electronics Engineers, Inc. - Material characterization using a quasi-optical measurement system

Author(s): N. Gagnon ; J. Shaker ; P. Berini ; L. Roy ; A. Petosa
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2003
Volume: 52
Page Count: 4
Page(s): 333 - 336
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/TIM.2003.810042
Regular:

The application of a quasi-optical apparatus in the determination of the relative permittivity of low-loss dielectric materials is presented in this paper. A description of the measurement system... View More

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