IEEE - Institute of Electrical and Electronics Engineers, Inc. - Data mining technology for failure prognostic of avionics

Author(s): V.A. Skormin ; V.I. Gorodetski ; L.J. Popyack
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2002
Volume: 38
Page Count: 16
Page(s): 388 - 403
ISSN (Paper): 0018-9251
DOI: 10.1109/TAES.2002.1008974
Regular:

Adverse environmental conditions have combined cumulative effects leading to performance degradation and failures of avionics. Classical reliability addresses statistically-generic devices... View More

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