IEEE Computer Society - Jitter testing for gigabit serial communication transceivers

Author(s): Yi Cai ; B. Laquai ; K. Luehman
Sponsor(s): IEEE Computer Society
Publisher: IEEE Computer Society
Publication Date: 1 January 2002
Volume: 19
Page Count: 9
Page(s): 66 - 74
ISSN (Paper): 0740-7475
DOI: 10.1109/54.980054

Proper testing of transceivers requires the ability not only to measure generated jitter but also to inject in-band as well as out-of-band jitter for an appropriate receiver tolerance test. The... View More