IEEE - Institute of Electrical and Electronics Engineers, Inc. - On diagnosing multiple stuck-at faults using multiple and single fault simulation in combinational circuits

Author(s): H. Takahashi ; K.O. Boateng ; K.K. Saluja ; Y. Takamatsu
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2002
Volume: 21
Page Count: 7
Page(s): 362 - 368
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/43.986429
Regular:

Diagnosing multiple stuck-at faults in combinational circuits using singleand multiple-fault simulation is proposed. The proposed method adds (removes) faults from a set of suspected faults... View More

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