IEEE - Institute of Electrical and Electronics Engineers, Inc. - Efficiency and reliability of call admission control schemes using call-level behavior

Author(s): S. Nananukul
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2002
Volume: 50
Page Count: 7
Page(s): 1,645 - 1,651
ISSN (Paper): 0090-6778
DOI: 10.1109/TCOMM.2002.803984
Regular:

While the efficiency of call admission control (CAC) schemes can be improved by taking advantage of call-level behavior, it is also important to make sure that the reliability of the CAC schemes... View More

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