IEEE - Institute of Electrical and Electronics Engineers, Inc. - Frequency domain analysis of analog single-event transients in linear circuits

Author(s): Y. Boulghassoul ; L.W. Massengill ; T.L. Turflinger ; W.T. Holman
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2002
Volume: 49
Page Count: 6
Page(s): 3,142 - 3,147
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2002.805330
Regular:

Using frequency-domain analysis techniques, a study of the relationship between the frequency spectrum of a single-event transient (SET) stimulus and the frequency response of internal circuit... View More

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