IEEE - Institute of Electrical and Electronics Engineers, Inc. - Charge collection in SOI capacitors and circuits and its effect on SEU hardness

Author(s): J.R. Schwank ; P.E. Dodd ; M.R. Shaneyfelt ; G. Vizkelethy ; B.L. Draper ; T.A. Hill ; D.S. Walsh ; G.L. Hash ; B.L. Doyle ; F.D. McDaniel
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2002
Volume: 49
Page Count: 11
Page(s): 2,937 - 2,947
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2002.805429
Regular:

Focused ion microbeam and broadbeam heavy-ion experiments on capacitors and SRAMs are used to investigate increased saturation upset cross sections recently observed in some... View More

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