IEEE - Institute of Electrical and Electronics Engineers, Inc. - High-speed X-ray imaging camera for time-resolved diffraction studies

Author(s): S.V. Tipnis ; V.V. Nagarkar ; V. Gaysinskiy ; S.R. Muller ; I. Shestakova
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2002
Volume: 49
Page Count: 5
Page(s): 2,415 - 2,419
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2002.803878
Regular:

We report here on a high-speed X-ray imaging camera, specifically developed for time resolved diffraction studies using synchrotron and laboratory X-ray sources. This camera is capable of... View More

Advertisement