CPSS - SPICE modeling of SiC MOSFET considering interface-trap influence

Author(s): Yuming Zhou ; Hangzhi Liu ; Tingting Yang ; Bing Wang
Publisher: CPSS
Publication Date: 1 March 2018
Volume: 3
Page(s): 56 - 64
ISSN (Paper): 2475-742X
DOI: 10.24295/CPSSTPEA.2018.00006
Regular:

SPICE modeling of silicon carbide (SiC) MOSFET considering the influence of interface traps has been carried out, which is able to describe the characteristics of the MOS transistors in all... View More

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