IEEE - Institute of Electrical and Electronics Engineers, Inc. - Nuclear models for proton induced upsets: a critical comparison

Author(s): A. Akkerman ; J. Barak ; Y. Lifshitz
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2002
Volume: 49
Page Count: 8
Page(s): 1,539 - 1,546
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2002.1039697
Regular:

This work studies the status of the nuclear models used for estimating single event upsets sensitivity and other radiation effects, induced by protons in microelectronic devices. An extended... View More

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