IEEE - Institute of Electrical and Electronics Engineers, Inc. - A method for correcting cosine-law errors in SEU test data

Author(s): L.D. Edmonds
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2002
Volume: 49
Page Count: 17
Page(s): 1,522 - 1,538
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2002.1039696
Regular:

Single-event upset tests often change the angle of the ion beam relative to the device to mimic a change in ion linear energy transfer, and the data are then converted via an assumed cosine law.... View More

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