IEEE - Institute of Electrical and Electronics Engineers, Inc. - Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser

Author(s): S. Buchner ; D. McMorrow ; A. Sternberg ; L. Massengill ; R.L. Pease ; M. Maher
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2002
Volume: 49
Page Count: 7
Page(s): 1,502 - 1,508
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2002.1039691
Regular:

The characteristics of single-event transients (SETs) generated in an LM119 voltage comparator with a pulsed laser have been studied under a wide variety of operating conditions. Those transients... View More

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