IEEE - Institute of Electrical and Electronics Engineers, Inc. - Energy dependence of proton damage in optical emitters

Author(s): A.H. Johnston ; T.F. Miyahira
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2002
Volume: 49
Page Count: 6
Page(s): 1,426 - 1,431
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2002.1039678
Regular:

The energy dependence of proton displacement damage effects is investigated for light-emitting diodes (LEDs) and laser diodes. Injection-enhanced annealing occurs more rapidly when devices are... View More

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