IEEE - Institute of Electrical and Electronics Engineers, Inc. - ASIC wafer test system for the ATLAS Semiconductor Tracker front-end chip

Author(s): F. Anghinolfi ; W. Bialas ; N. Busek ; A. Ciocio ; D. Cosgrove ; V. Fadeyev ; C. Flacco ; M. Gilchriese ; A.A. Grillo ; C. Haber ; J. Kaplon ; C. Lacasta ; W. Murray ; H. Niggli ; T. Pritchard ; F. Rosenbaum ; H. Spieler ; T. Stezelberger ; C. Vu ; M. Wilder ; H. Yaver ; F. Zetti
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2002
Volume: 49
Page Count: 6
Page(s): 1,080 - 1,085
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2002.1039618
Regular:

An application-specific integrated circuit (ASIC) wafer test system has been developed to provide comprehensive production screening of the ATLAS Semiconductor Tracker front-end chip... View More

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