IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simple technique for measuring source reflection coefficient while characterizing active devices

Author(s): G. Madonna ; A. Ferrero
Sponsor(s): IEEE Microwave Theory and Techniques Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2002
Volume: 50
Page Count: 6
Page(s): 564 - 569
ISSN (Paper): 0018-9480
ISSN (Online): 1557-9670
DOI: 10.1109/22.982236
Regular:

The measurement of the source reflection coefficient is fundamental for noise, as well as large-signal testing of microwave active devices. This paper describes a simple yet rigorous technique for... View More

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