IEEE Computer Society - ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed-Signal Integrated Circuits

Author(s): Anthony Coyette ; Baris Esen ; Nektar Xama ; Wim Dobbelaere ; Ronny Vanhooren ; Georges Gielen
Publisher: IEEE Computer Society
Volume: PP
Page(s): 1
ISSN (Electronic): 2168-2364
ISSN (Paper): 2168-2356
DOI: 10.1109/MDAT.2018.2799800

This paper presents a new method to automate the testing of analog and mixed-signal integrated circuits. The proposed workflow, called ADAGE, combines two methods from literature: the topology... View More