IEEE - Institute of Electrical and Electronics Engineers, Inc. - A study of high-frequency characteristics of write heads with the ac-phase high-frequency magnetic force microscope

Author(s): M. Abe ; Y. Tanaka
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2002
Volume: 38
Page Count: 5
Page(s): 45 - 49
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/TMAG.2002.988909
Regular:

We demonstrate frequency characteristic measurement methods of write head with an ac-phase high-frequency magnetic force microscope (HF-MFM). Two measurement methods allow separating the... View More

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