IEEE - Institute of Electrical and Electronics Engineers, Inc. - Resolution in model-based measurement

Author(s): A. van den Bos
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2002
Volume: 51
Page Count: 6
Page(s): 1,055 - 1,060
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/TIM.2002.806031
Regular:

In measurement practice, the concept resolution is usually associated with the ability to distinguish two overlapping components of the same kind in observations. The original concept, Rayleigh's... View More

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