IEEE - Institute of Electrical and Electronics Engineers, Inc. - Coverage estimation using statistics of the extremes for when testing reveals no failures

Author(s): L.M. Kaufman ; B.W. Johnson ; J.B. Dugan
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Distributed Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2002
Volume: 51
Page Count: 10
Page(s): 3 - 12
ISSN (Paper): 0018-9340
DOI: 10.1109/12.980013
Regular:

The existing classes of fault coverage models require an a priori distribution for collected data in their analysis. Using these models, analyses can be performed using various assumed... View More

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