IEEE - Institute of Electrical and Electronics Engineers, Inc. - MSFE: Blind image quality assessment based on multi-stage feature encoding

2017 IEEE International Conference on Image Processing (ICIP)

Author(s): Qiuping Jiang ; Feng Shao ; Gangyi Jiang
Sponsor(s): Instit. of Electr. and Electron. Eng. Signal Process. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2017
Conference Location: Beijing, China
Conference Date: 17 September 2017
Page(s): 3,160 - 3,164
ISBN (Electronic): 978-1-5090-2175-8
ISBN (USB): 978-1-5090-2174-1
ISSN (Electronic): 2381-8549
DOI: 10.1109/ICIP.2017.8296865
Regular:

Blind image quality assessment (BIQA) methods based on visual codebooks have received much attention due to its prominent generalization capacity across different image domains. Existing... View More

Advertisement