IEEE - Institute of Electrical and Electronics Engineers, Inc. - The variation of J/sub cgb/ with GB misorientation and inclination measured using the scanning SQUID microscope

Author(s): J.W.H. Tsai ; Siu-Wai Chan ; J.R. Kirtley ; S.C. Tidrow ; Q. Jiang
Sponsor(s): Council on Superconductivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2001
Volume: 11
Page Count: 4
Page(s): 3,880 - 3,883
ISSN (Paper): 1051-8223
ISSN (Online): 1558-2515
DOI: 10.1109/77.919914
Regular:

The scanning SQUID microscope was used to measure the Josephson penetration length (/spl lambda//sub J/) along the grain boundary. The J/sub c/ across the grain boundary was then derived from the... View More

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