IEEE - Institute of Electrical and Electronics Engineers, Inc. - Corrections to "The path loss model for UMTS vehicular test environment"

Author(s): J.M. Hernando ; L. Mendo
Sponsor(s): IEEE Vehicular Technology Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Volume: 50
Page Count: 1
ISSN (Paper): 0018-9545
ISSN (Online): 1939-9359
DOI: 10.1109/25.917959
Regular:

Some inaccuracies have been found in the path loss model that has been proposed by ETSI (Universal Mobile Telecommunications System; Selection Procedures for the Choice of Radio Transmission... View More

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