IEEE - Institute of Electrical and Electronics Engineers, Inc. - Rough K-means and support vector machine based brain tumor detection

2017 International Conference on Advances in Computing, Communications and Informatics (ICACCI)

Author(s): Amiya Halder ; Oyendrila Dobe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2017
Conference Location: Udupi (Near Mangalore), India, India
Conference Date: 13 September 2017
Page(s): 116 - 120
ISBN (Electronic): 978-1-5090-6367-3
ISBN (USB): 978-1-5090-6366-6
DOI: 10.1109/ICACCI.2017.8125826
Regular:

In this paper, we present a proposed algorithm to classify brain MRI as tumor-free or tumor present. For computing difference between normal and abnormal MR images, a set of features is... View More

Advertisement