IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement and characterization of HEMT dynamics

Author(s): A.E. Parker ; J.G. Rathmell
Sponsor(s): IEEE Microwave Theory and Techniques Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2001
Volume: 49
Page Count: 7
Page(s): 2,105 - 2,111
ISSN (Paper): 0018-9480
ISSN (Online): 1557-9670
DOI: 10.1109/22.963144
Regular:

The variation of high electron-mobility transistor (HEMT) large-signal behavior with a change in operating condition is examined with a view to understanding the dynamics involved and developing a... View More

Advertisement