IEEE - Institute of Electrical and Electronics Engineers, Inc. - Kinetics of thermal decay in NiMn and PtMn spin valve devices

Author(s): S. Gider ; L. Baril ; D. Mauri
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2001
Volume: 37
Page Count: 3
Page(s): 1,704 - 1,706
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/20.950943
Regular:

The thermal stability of NiMn and PtMn exchange-biased spin valves is studied in fully integrated magnetic recording heads. Constant temperature and voltage are applied to simulate stress... View More

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