IEEE - Institute of Electrical and Electronics Engineers, Inc. - Neural networks for large- and small-signal modeling of MESFET/HEMT transistors

Author(s): M. Lazaro ; I. Santamaria ; C. Pantaleon
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2001
Volume: 50
Page Count: 7
Page(s): 1,587 - 1,593
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/19.982950
Regular:

In this paper, we present a comparative study of three neural networks-based solutions for large- and small-signal modeling of MESFET and HEMT transistors. The first two neural architectures are... View More

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