IEEE - Institute of Electrical and Electronics Engineers, Inc. - Cellular automata-based recursive pseudoexhaustive test pattern generator

Author(s): P. Dasgupta ; S. Chattopadhyay ; P.P. Chaudhuri ; I. Sengupta
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Distributed Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2001
Volume: 50
Page Count: 9
Page(s): 177 - 185
ISSN (Paper): 0018-9340
DOI: 10.1109/12.908993
Regular:

This paper presents a recursive technique for generation of pseudoexhaustive test patterns. The scheme is optimal in the sense that the first 2/sup k/ vectors cover all adjacent k-bit spaces... View More

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