IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using inspection data for defect estimation

Author(s): S. Biffl
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2000
Volume: 17
Page Count: 8
Page(s): 36 - 43
ISSN (Paper): 0740-7459
DOI: 10.1109/52.895166
Regular:

To control projects, managers need accurate and timely feedback on the quality of the software product being developed. I propose subjective team estimation models calculated from individual... View More

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