IEEE - Institute of Electrical and Electronics Engineers, Inc. - A comparison of predictive measures of problem difficulty in evolutionary algorithms

Author(s): B. Naudts ; L. Kallel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2000
Volume: 4
Page Count: 15
Page(s): 1 - 15
ISSN (Paper): 1089-778X
ISSN (Online): 1941-0026
DOI: 10.1109/4235.843491
Regular:

This paper studies a number of predictive measures of problem difficulty, among which epistasis variance and fitness distance correlation are the most widely known. Our approach is based on... View More

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