IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of Dirac-structure edges with wavelet transform

Author(s): Y.Y. Tang ; L. Yang ; J. Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2000
Volume: 30
Page Count: 17
Page(s): 93 - 109
ISSN (Paper): 1083-4419
ISSN (Online): 1941-0492
DOI: 10.1109/3477.826950
Regular:

This paper aims at studying the characterization of Dirac-structure edges with wavelet transform, and selecting the suitable wavelet functions to detect them. Three significant characteristics of... View More

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