IEEE - Institute of Electrical and Electronics Engineers, Inc. - Coaxial current transformer for test and characterization of high-power semiconductor devices under hard and soft switching

Author(s): R.O.C. Lyra ; B.J. Cardoso Filho ; V. John ; T.A. Lipo
Sponsor(s): IEEE Industry Applications Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2000
Volume: 36
Page Count: 8
Page(s): 1,181 - 1,188
ISSN (Paper): 0093-9994
ISSN (Online): 1939-9367
DOI: 10.1109/28.855977
Regular:

The use of a coaxial current transformer (CCT) is an interesting choice for pulsed measurement of current through power devices during switching transients. The CCT is used to reflect current for... View More

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