IEEE - Institute of Electrical and Electronics Engineers, Inc. - Generating test-cases from an object-oriented model with an artifical-intelligence planning system

Author(s): A. Von Mayrhauser ; R. France ; M. Scheetz ; E. Dahlman
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2000
Volume: 49
Page Count: 11
Page(s): 26 - 36
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/24.855534
Regular:

Black-box test-generation requires a model of the system under test to describe what is to be tested. Testing criteria and test objectives define how it is to be tested. This paper describes an... View More

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