IEEE Computer Society - Adaptive ECC for Tailored Protection of Nanoscale Memory

Author(s): Dongyeob Shin ; Jongsun Park ; Jangwon Park ; Somnath Paul ; Swarup Bhunia
Publisher: IEEE Computer Society
Publication Date: 1 December 2017
Volume: 34
Page(s): 84 - 93
ISSN (Electronic): 2168-2364
ISSN (Paper): 2168-2356
DOI: 10.1109/MDAT.2016.2615844
Regular:

Following technology scaling, runtime failure has emerged as one of the major challenges in modern VLSI designs under the increased parametric variability and low supply voltage. This issue is... View More

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