IEEE Computer Society - Challenges and Trends in Modern SoC Design Verification

Author(s): Wen Chen ; Sandip Ray ; Jayanta Bhadra ; Magdy Abadir ; Li-C Wang
Publisher: IEEE Computer Society
Publication Date: 1 October 2017
Volume: 34
Page(s): 7 - 22
ISSN (Electronic): 2168-2364
ISSN (Paper): 2168-2356
DOI: 10.1109/MDAT.2017.2735383
Regular:

This paper provides a tutorial overview of the state-of-the-art in verification of complex and heterogeneous Systems-on-Chip. The authors discuss current industrial trends and key research... View More

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