IEEE - Institute of Electrical and Electronics Engineers, Inc. - Low-frequency noise in single growth planar separate absorption, grading, charge, and multiplication avalanche photodiodes

Author(s): S. An ; M.J. Deen
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2000
Volume: 47
Page Count: 7
Page(s): 537 - 543
ISSN (Paper): 0018-9383
ISSN (Online): 1557-9646
DOI: 10.1109/16.824724
Regular:

The current bias-dependence of low-frequency noise spectra in single growth planar separate absorption, grading, charge, and multiplication (SAGCM) APDs was studied. We have also investigated the... View More

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