IEEE Computer Society - Emerging Memory Technologies

Author(s): Jorg Henkel
Publisher: IEEE Computer Society
Publication Date: 1 June 2017
Volume: 34
Page(s): 4 - 5
ISSN (Paper): 2168-2356
ISSN (Online): 2168-2364
DOI: 10.1109/MDAT.2017.2695879

The focus of this issue of IEEE Design&Test (D&T) is on merging memories and is brought to us by Yiran Chen, Tei-Wei Kuo, and Barbara de Salvo. Emerging memory technologies have significant... View More